Series ended PI Meeting
Silicon Wafer Engineering & Defect Science Center (SiWEDS)

About the series

I/UCRC Industrial Advisory Board (IAB) meeting.

Visit http://www.nsf.gov/eng/iucrc/directory/sweds.jsp  for more information.

Past events in this series

May 19–20, 2005, 7:15 a.m. – 3:45 p.m.